Test Generation I

Tuesday, July 19th, 10:45-12:25, Salon A – Session Chair: Alessandro Orso

eXpress: Guided Path Exploration for Efficient Regression Test Generation

Kunal Taneja, Tao Xie, Nikolai Tillmann, and Jonathan De Halleux (North Carolina State University, USA; Microsoft Research, USA)

Statically-Directed Dynamic Automated Test Generation

Domagoj Babic, Lorenzo Martignoni, Stephen McCamant, and Dawn Song (UC Berkeley, USA)

Automatic Partial Loop Summarization in Dynamic Test Generation (Distinguished Paper)

Patrice Godefroid and Daniel Luchaup (Microsoft Research, USA; University of Wisconsin at Madison, USA)

Symbolic Execution with Mixed Concrete-Symbolic Solving

Corina Pasareanu, Neha Rungta, and Willem Visser (NASA Ames Research Center, USA; Stellenbosch University, South Africa)