Test Generation II

Thursday, July 21st, 10:55-12:10, Ballroom – Session Chair: Sebastian Elbaum

Combined Static and Dynamic Automated Test Generation

Sai Zhang, David Saff, Yingyi Bu, and Michael D. Ernst (University of Washington, USA; Google Inc, USA; UC Irvine, USA)

Generating Parameterized Unit Tests

Gordon Fraser and Andreas Zeller (Saarland University, Germany)

High Coverage Testing of Haskell Programs

Tristan Allwood, Cristian Cadar, and Susan Eisenbach (Imperial College Longon, UK; Imperial College London, UK)